Guo J. X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

Wiley-VCH, Verlag, 2010. — 263 p. — ISBN 9783527322886X-Rays in Nanoscience comprehensively explores the use of X-rays in the determination of surface structures by treating spectroscopy, microscopy, and scattering techniques, all of them using different methodology. With nanotechnology becoming increasingly important, this groundbreaking text covers methods that are indispensable for determining the structure of materials, making it an essential resource for analytical chemists, materials scientists, surface chemists, spectroscopists, and polymer chemists.
In this book, recent achievements of synchrotron radiation X-ray applications in nanoscience have been reviewed. The principle of X-ray scattering, spectroscopy, and spectromicroscopy, and the current state-of-art developments in the optics and instrumentation are presented and discussed. The potential of the advanced synchrotron radiation–based techniques is illustrated using selected results obtained at synchrotron facilities. A systematic collection of the advanced tools will meet the strong needs for a wide user community with background ranging from research institutions, universities, to industry. It will be beneficial for graduate students, postdocs as well as for professional researchers.High Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and their Spin Dynamics
Advances in Magetization Dynamics Using Scanning Transmission X-Ray Microscopy
Scanning Photoelectron Microscopy for Novel Nanomaterials Characterization
Coherent X-Ray Diffraction Microscopy
Many-Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectroscopy
Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials