DiNardo N.J. Nanoscale Characterization of Surfaces and Interfaces

VCH, Weinheim, 1994. 163 pp.This monograph describes the application of atomic force microscopy (AFM) and scanning transmission electron microscopy (STM) to studying nanomaterials. It contains a wide array of benchmark experiments and relevant examples and extensions of the capabilities which these made available.List of Symbols and AbbreviationsScanning Tunneling Microscopy (STM)
Atomic Force Microscopy
Manipulation of Atoms and Atom Clusters on the Nanoscale
Spin-Offs of STM - Non-Contact Nanoscale Probes
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