Abramovici M., Breuer M.A., Friedman A.D. Digital Systems Testing and Testable Design

IEEE + Wiley, 1990, 652 pagesThis book provides a comprehensive and detailed treatment of digital systems testing and testable design. These subjects are increasingly important, as the cost of testing is becoming the major component of the manufacturing cost of a new product. Today, design and test are no longer separate issues. The emphasis on the quality of the shipped products, coupled with the growing complexity of VLSI designs, require testing issues to be considered early in the design process so that the design can be modified to simplify the testing process.
This book was designed for use as a text for graduate students, as a comprehensive reference for researchers, and as a source of information for engineers interested in test technology (chip and system designers, test engineers, CAD developers, etc.). To satisfy the different needs of its intended readership the book (1) covers thoroughly both the fundamental concepts and the latest advances in this rapidly changing field, (2) presents only theoretical material that supports practical applications, (3) provides extensive discussion of testable design techniques, and (4) examines many circuit
structures used to realize built-in self-test and self-checking features.Modeling
Logicsimulation
Fault modeling
Fault simulation
Testing for single stuck faults
Testing for bridging faults
Functional testing
Design for testability
Compression techniques
Built-in self-test
Logic-level diagnosis
Self-checking design
Pla testing
System-level diagnosis